Materials Growth & Measurement Laboratory

Czech open research infrastructure

Van der Waals materials

Full project name:

Physics of the magnetic layered van der Waals materials

Project Details

The goal of the bilateral Czech-Korean project is to improve comprehension of the magnetism in the recently discovered layered van der Waals (vdW) crystals, especially the transition metal ferromagnetic trihalides, VI3 and CrI3. Properties of these vdW materials both in their bulk and thin film form, represent an exciting field of condensed matter physics due to the strong anisotropy related to the low dimensionality given by the weak vdW bonding between the ferromagnetic layers. The investigation of the low-temperature magnetic structures and magnetocrystalline anisotropy, as well as the tuning of the exchange interactions and dimensionality of magnetism by hydrostatic pressure, forms the main part of this project. The research comprises long-term sample-preparation experience, numerous x-ray, surface, and bulk methods to characterize crystals and thin films in a broad temperature range, and neutron diffraction to explore the magnetic moment configuration in the bulk samples.

  • Principal Investigator
    Dr. Marie Kratochvílová
  • Team
    1 professor, 5 researchers, 2 students
  • Duration
    2019 - 2020
  • Research area
    magnetism in van der Waals systems

Dr. Marie Kratochvílová

Principle investigator

Current position: postdoctoral researcher at the Department of Condensed Matter Physics, Faculty of Mathematics and Physics, Charles University.

Recent research activity: low-dimensional magnetism, search for new Heusler alloys and martensitic materials with an application potential, quantum critical phenomena, multiferroic materials, structural phase transitions.

Expertise employed in the project: sample characterization based on EDX and XRD methods, magnetization and specific heat measurements at extreme conditions (low temperatures, high magnetic fields, hydrostatic pressure).

Project is also lead by Prof. Vladimír Sechovský

Role of MGML in the Project

MGML instruments are to be employed for characterization by x-ray diffraction, measurement of bulk and surface properties down to lowest temperatures.

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