The MGML offers a wide variety of x-ray instrumentation for measurements of single crystals, polycrystalline bulk and powder materials, nanocrystalline samples, thin coatings, multilayers and epitaxial layers.

The instruments can operate with various x-ray wavelengths (Co, Cu, Mo and Ag), and in different geometries: Bragg-Brentano geometry, medium resolution parallel beam setting, high resolution geometry, with monochromatic Kα₁ radiation and in coplanar and non-coplanar (in-plane) mode. Various sample environments, low and high temperature chambers, deformation (tensile and compression) stage, reaction chamber are available for individual diffractometers.

Methodologically the MGML offers the single crystal diffraction – structure solution and refinement, qualitative and quantitative phase analysis, the real structure of material studies: preferred orientation of crystallites – texture measurements, residual stress measurements, reflectivity measurements, rocking curve measurements, reciprocal space mapping, pair distribution function – total scattering measurements, small angle x-ray scattering and grazing-incidence small angle x-ray scattering.