Typical applications
X-ray diffraction on polycrystalline powder and bulk samples, non-ambient x-ray diffraction between RT and 1600°C.
Available methods
- x-ray diffraction measurements on polycrystalline powder and bulk samples
- high temperature XRD studies
- qualitative and quantitative phase analysis
- structure refinement
Technical specification
- Θ-Θ vertical goniometer
- sealed tube sources
- Cu and Co radiation
- 2x parallel beam mirror
- automatic divergence, anti scatter and receiving slits
- parallel plate collimator
- 1D detector PIXcel
- motorized sample stage
- high temperature chamber
- RT – 1600°C
- MRI basic with direct and radiation heating
