- Damla Yesilpinar: Mechanical and Chemical Interactions at Atomically Defined Contacts
- 10. 11. 2021, 14:10
- online (zoom)
- online meetink link (Passcode will be provided on request)
- more information
Abstract:
In scanning probe microscopy, the probe tip scans the sample surface, providing information about the area of interest, down to atomic resolution. During scanning, such tip exerts a force on the surface which enables precise relocation of the adsorbed atoms or molecules, known as lateral manipulation. Controlling the identity of the tip terminating species in non-contact atomic force microscopy (NC-AFM) is the key for sub-molecular imaging [1]. Such atomically defined tips also allow quantitative and reproducible force calculations with piconewton precision [2]. However, a direct comparison of the performances of different tip terminations is needed for a profound standardization of these experiments. In this study, we compare the manipulation abilities of four diferent probe tips, namely Cu-, Xe-[3], CO-[1,3] and O-terminated Cu-(CuOx-) tips [4]. Using a nanostructured copper-oxide surface as a benchmark system, we investigated their capabilities in quantitative force measurements during lateral manipulation of adsorbed, single Xe atoms. Supported by DFT calculations, our results allow a detailed discussion about the interplay between chemical reactivity and nanomechanical properties at the tip-sample junctions. Chemically passivated, rigid CuOx-tip stand out with its superior performance in the manipulation experiments, qualifying to be a standard probe for force measurements.
[1] L. Gross et.al., Science 325 5944 (2009)
[2] J. Berwanger et.al., Phys. Rev. B 98 195409 (2018)
[3] F. Mohn et al., Appl. Phys. Lett. 102 073109 (2013)
[4] H. Monig et al., Nat. Nanotechnol. 13 (2018)