Materials Growth & Measurement Laboratory

Czech open access research infrastructure

Fib

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Micro structuring using Focused Ion Beam

The basic condition for conduction relevant research is the availability of suitable samples. Despite the many crystal growth techniques available in MGML, several growth difficulties can always remain unsolved leading to very small or multiphase samples. We have implemented a microstructuring technique of multiphase or irregular samples to create devices for charge transport measurements. This allows us fabrication of samples with well-defined crystal orientation and dimensions so the resistivity can be determined with high precision despite sample size.

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